Dr. Simon Muntwyler
FemtoTools, Switzerland
April 29, 2013 | 12:00 to 01:00 | 521 Cory Hall, Hogan Room
Host: Niels Quack
The micromechanical investigation of microscopic samples can provide valuable insight into their structure or functionality and plays an important role in many areas such as material science, biological research or the development of MEMS/NEMS. Based on the results of more than 10 years of research at ETH Zurich, a MEMS-based microforce sensing technology has evolved that allows for a new level of accurate, truly quantitative measurement of forces and mechanical properties in the micro- and nanodomain. The first part of the program will focus on a highly adaptable micromechanical testing system based on capacitive microforce sensing. The second part will focus on the challenge of accurately calibrating microforce-sensing devices traceable to the Si-units and the investigation of their measurement uncertainty according to the ISO Guide to the Expression of Uncertainties in Measurements (GUM).
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