Dr. Peter Hintenaus
University of Salzburg, Austria
February 17, 2009 | 12:00 to 01:00 | 521 Cory Hall, Hogan Room
Host: John Huggins
Besides being routinely used for laboratory analysis of the chemical composition of substances, infrared spectrometers were applied to observing chemical reactions in micromixing devices and to measuring the surface temperature of wafers during epitaxial deposition of silicon films. Our device integrates a Fourier-Transform spectrometer, an engine for doing (chemical) analysis and a programmable logic controller. The spectrometer offers a signal to noise ratio better than 12000 at a resolution of 3 wave numbers and a measurement time of one second. It can be configured for up to 80 single shot measurements per second at a resolution of 12/cm. For performing chemical analyses, we designed a virtual machine that can be freely programmed. In this talk we sketch the basis of Fourier-Transform spectrometry motivated by numerical procedures for computing spectra. We cover the mechanisms we designed for doing chemometrics and present our concepts for automating the periphery of the spectrometer.
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