Prof. Ken-ya Hashimoto
Chiba University Japan
June 12, 2008 | 11:10 to 12:40 | 521 Cory Hall, Hogan Room
Host: Jan Kuypers
1. Future of SAW Devices - This lecture discusses research trends of the RF SAW/BAW filters, focusing on their possible integration into RF ICs. First, modern SAW/BAW technologies are introduced, and it is shown how high performances are achievable by the use of current state-of-the-art technologies. Secondly, current front-end modules are surveyed, and then it is discussed how they are going to be integrated with active elements. Finally, System-in-Package (SiP) and System-on-Chip (SoC) technologies are discussed as a possible solution for the full integration of the RF front end including SAW/BAW devices into RF ICs. 2. A Fast Scanning Laser Probe for RF SAW/BAW Devices - This lecture describes the development of a new laser probe for RF SAW/BAW devices. The Sagnac interferometer was introduced for the selective detection of RF SAW/BAW propagation and vibration. A high-pass characteristic of the interferometer makes the measurement very insusceptible to the low-frequency vibration. Combining such a feature with the advanced scanning technique and optimized detection system, we were successfully able to maximize the scanning speed without sacrificing the signal-to-noise ratio and sensitivity of the measurement with the driving frequency upto 2.5 GHz. In addition, since the system is phase-sensitive, the measured SAW field in the real space domain is readily converted into the wavenumber domain by the 2D Fast Fourier Transform (FFT). The system was applied to the characterization of RF SAW/BAW devices and showed its effectiveness in device diagnosis.
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