Dr. Yves Emery
CEO, Lyncée Tec SA
September 13, 2016 | 12:00 to 01:00 | 490 Cory Hall
Host: David Horsley
Digital Holographic Microscopes (DHM®) are 3D optical profilometers with unique temporal capacities. Contrary to usual measurement techniques, DHM® does not require any scanning mechanism to acquire information. Time sequences of 3D data are therefore acquired at camera rate providing 4D topography measurements.
Spatial resolution is interferometric where: vertically resolution is below the nanometer for any choice of objective, and laterally, it is limited by the diffraction of objective as any other microscopic system. Temporally, acquisition at 1000 fps and at 25 MHz in stroboscopic mode is commonly achieved. The analysis software provides live analysis of the measurements up to 100 measurements per second. Faster phenomenon can be post-analyzed.
DHM® are therefore not only the ideal systems for 3D topography characterization of many static samples. They provide unrivaled possibilities for measurements over large field of view with fast stitching procedure, for screening of large samples, for studying moving and deformable samples, and thanks to the short acquisition time, for on-flight in-line quality control, even in presence of environmental vibrations.
The system optical design enables to measure samples in situ in many environments: liquid, gas, vacuum, high or low temperature.
A variety of applications solved by DHM® will be presented. Among others: topography and surface metrology, MEMS dynamical response analysis, micro fluidic devices characterization, semi-transparent structure on Si wafers measurements, in-line quality control, and smart surfaces analysis.
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